Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?

• Annalena Wolff

Beilstein J. Nanotechnol. 2021, 12, 965–983, doi:10.3762/bjnano.12.73

• Annalena Wolff Central Analytical Research Facility, Institute for Future Environments, Queensland University of Technology, 2 George St, Brisbane 4000, QLD, Australia 10.3762/bjnano.12.73 Abstract Electron backscatter diffraction (EBSD) is a powerful characterization technique which allows the

• , then the overall damage to the specimen is reduced. Keywords: electron backscatter diffraction (EBSD); Ga; helium ion microscope (HIM); ion polishing; Ne; Introduction The helium ion microscope (HIM) has sparked interest in many disciplines since its commercial release in the first decade of the 21st

• steps are designed to reduce the thickness of the amorphous layer on each side of the TEM lamella and to minimize artefacts [24], procedures and induced artefacts for other techniques such as electron backscatter diffraction (EBSD) polishing are not well documented in the literature. The work presented

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• diffusivity of Li-ions in the material [29][30][33][35][36]. The basic fact that the ESM signal itself is dependent on the presence of ionic species was shown by Schön et al. [37] and Sasano et al. [38][39], who combined EDX, electron backscatter diffraction (EBSD) and ESM measurements. Therefore, even with

Correlative electrochemical strain and scanning electron microscopy for local characterization of the solid state electrolyte Li_1.3Al_0.3Ti_1.7(PO₄)₃

• Nino Schön,
• Deniz Cihan Gunduz,
• Shicheng Yu,
• Hermann Tempel,
• Roland Schierholz and
• Florian Hausen

Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148

• -ion mobility in Li0.33La0.56TiO3 using scanning electron microscopy (SEM) with electron backscatter diffraction (EBSD) and electrochemical strain microscopy (ESM) [21]. The authors correlate variations in the Li-ion mobility detected by ESM with limitations in the Li-ion migration pathway. ESM is a

Effect of triple junctions on deformation twinning in a nanostructured Cu–Zn alloy: A statistical study using transmission Kikuchi diffraction

• Silu Liu,
• Xiaolong Ma,
• Lingzhen Li,
• Liwen Zhang,
• Patrick W. Trimby,
• Xiaozhou Liao,
• Yusheng Li,
• Yonghao Zhao and
• Yuntian Zhu

Beilstein J. Nanotechnol. 2016, 7, 1501–1506, doi:10.3762/bjnano.7.143

• problematic when studying the relationship between twins and triple junctions from a statistical view and when the sample has a significant texture. In the last few years, an innovative microscopy technique has been developed using a conventional electron backscatter diffraction (EBSD) system in a scanning

Channeling in helium ion microscopy: Mapping of crystal orientation

• Vasilisa Veligura,
• Gregor Hlawacek,
• Raoul van Gastel,
• Harold J. W. Zandvliet and
• Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 501–506, doi:10.3762/bjnano.3.57

• of incidence of the beam is used to perform crystal orientation mapping. This procedure provides information that is comparable to electron backscatter diffraction (EBSD). We also show that a fully fledged scattering calculation is not necessary to access this information. Simple geometric